Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.
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Standard test methods for characterizing duplex grain sizes – CERN Document Server
Presentation of the data as a histogram or a frequency plot is also shown. Accordingly, the longitudinal orientation is recommended, with one exception.
No other units of measurement are included in this standard. Use of the grid is described in 8. A further example appears in Fig.
If duplex grain size is suspected in a product too large to be polished and etched xstm a single specimen, macroetching should be considered as a rst step in evaluation. Results will be incorporated here when available. In this example, the results would be reported as: Signicance and Use 5.
These are available from microscope manufacturers. Click here to display results spreadsheet.
ASTM E – 02() – Standard Test Methods for Characterizing Duplex Grain Sizes
Count the number of grid points falling within the particular grain size region being evaluated. For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen.
Estimate the area fraction for the grain size region being evaluated as the number of grid points falling within the region, divided by the total number of grid points that lie within the total image outline the grid must be large enough to completely cover the total image. All required measurements are e11811 in the “Current Field Results” box. The area fraction occupied by the ne grain was calculated as the total intercept length in the ne grain region w1181 Practice E FIG.
However, these steels may also exhibit a bimodal grain size condition solely within the ferrite grain structure. Etch specimens so that all xstm boundaries are distinct and easily visible.
ASTM E1181 – 02(2015)
This standard is subject to revision at any time by the responsible technical committee and must be reviewed every ve years and if not revised, either reapproved or withdrawn.
For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen. The histogram suggests that the specimen evaluated contains more than a single distribution of grain sizes.
If the specimen being examined is the full cross-section of a round bar, the longitudinal section should not be used to estimate the area fraction occupied by different grain sizes. Duplex grain structures for example, multiphase alloys ast, not necessarily duplex in grain astn, and as such are not the subject of these methods.
If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a first step in evaluation.
The operator can set any size field area using the Set Field button.
The most precise estimate of the area fractions occupied by each grain size will be obtained by evaluating the entire surface of that specimen. Any of the Intercept Procedures of E may be used, within the regions of distinct grain size. Grain Size Control Panel: Also use the planimeter to measure the total area of the image. Use of the grid is described in Methods E Calibration is set by clicking on the “Calibrate” choice in the Dialog Menu Bar. Of these, the Comparison Procedure is the simplest, but offers the least precision.
Referenced Documents purchase separately The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size.
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Compare such gures with eyepiece or projected images from a microscope, or with photomicrographs. When the measurements are completed for one grid position, rotate the grid to another position, and repeat the entire process. And, as an alternative, the test methods offer a procedure for statistically determining the distribution of all the grain sizes present in a duplex grain size specimen.
Use this average and the overall product dimensions to calculate an estimated area fraction for that surface layer. Begin by outlining the distinct grain size regions in a given image, either on a transparent overlay placed over the projected image, or directly on a photomicrograph.
If microscopic examination is subsequently necessary, individual specimens must be taken to satm estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well. An example of that bimodal ferrite grain size is shown in Fig. An example photomicrograph of the wide-range condition appears in Fig.